Tenders Are Invited For Apparus For Measuring Radiation - Supply Of A Bench Structural Danalysis Of Thin Lay ... in France

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Apparus For Measuring Radiation - Supply Of A Bench Structural Danalysis Of Thin Layers And Nanostructures By Different X -Rays For The Campus Decully De Centrale Lyon. This Consultation Concerns The Supply Of A Structural Analysis Bench For Thin Layers And Nanostructures By X -Ray Diffraction, Below Designated By X -Ray Diffractometer, Allowing The Analysis Of Thin Layers And Nanostructures, In Particular Those Resulting From The Buildings Of Growth And Deposits Of The Nanolyon Platform Of The Inl But Also Other Laboratories Of Central Lyon. This Consultation Includes Basic: - The Supply And Delivery Of The X -Ray Diffractometer Until The Dinstallation Place, - Installation And Commissioning Of Hardware Equipment, - Training In Use (Hardware And Associated Software), Maintenance And Safety Of Hardware, - Lequippement Guarantee (Parts, Hand Doeuvre And Displacement) And Associated Software Update Of Lacquisition (Unique Purchase) Of Specific Scientific Equipment. Place Of Delivery: According To The Terms Specified In The Specifications (Path Plan For Linstallation Of Lequiably Supplied In Annex)

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