Contract Notice Laboratory Optical And Precision Equipments Excl Glasses Deliv And Commissioning Of A Focused Ion Beam V0505 2019 Description The Device Will Be Used For High Resolution Microstructure Analysis In The Context Of Additive Manufacturing Whereby A 3D Microstructure Analysis With The Simultaneous Possibility Of High Precision Sample Preparation Should Be Combined As A High Resolution Field Emission Scanning Electron Microscope The Device Is Intended To Provide The Possibility To Process Remove The Sample Locally Using Xe Plasma Pfib Without The Formation Of Intermetallic Phases At High Rates The Device Must Be Delivered And Put Into Service On Site Time Limit For Receipt Of Tenders Or Requests To Participate Date 12 08 2019 Local Time 10 00 Disclaimer The Above Text Is Machine Translated For Accurate Information Kindly Refer The Original Document
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