Contract Notice Scanning Electron MicroscopesScanning Electron MicroscopeDescription A Scanning Electron Microscope Will Be Published Which Will Allow The Micro Testing Of Materials And Miniature Samples At High Temperatures Up To 1 400Oc Under High Vacuum And Partial Vacuum Allows The Institute For Test And Simulation Of Gas Turbines Of The German Aerospace Center E V Intends To Obtain A Scanning Electron Microscope And A Tensile Pressure Microtest Module For Operation With Light And Scanning Electron Microscopes With The Following Specifications Requirement For The Scanning Electron Microscope For The Augsburg Location Device With Field Emission Cathode And Modern Ion Optical Column Low Vacuum And Or Esem Mode Maximum Chamber Pressure Not Less Than 500 Pa Minimum Resolution Of The Electron Optics In A High Vacuum 1 Nm At 30 Kev Minimum Resolution Of The Electron Optics In A High Vacuum 3 Nm At 1 Kev Oil Free Vacuum System Heating Module For In Situ Investigations Up To 1 400Oc In Esem Mode High Vacuum Detectors Se Backscattered Electron Detector Retractable Segmented Low Level Detectors Se Detector Backscattered Electron Detector In Lens Or In Column Se Detector Edx Detector Retractable Sdd Type Min 50 Mm2Detector Area Usable At 0OAnd At 70OSample Tilting At Sample Temperatures From Room Temperature Up To 800Oc Ir Protection Cap Permissible For Detector Ebsd Detector Count Rate 3 000 Ipps Retractable Usable At Sample Temperatures From Room Temperature To At Least 1 000Oc Integration Of Edx And Ebsd In The Same Control And Application Software Application Software Integrated Plasma Cleaner Circulation Cooler Active Vibration Compensation Incl Installation Magnetic Field Compensation Aluminum Profile Frame Incl Installation Installation On Site Appropriate Training For The Esem And The Eds Ebsd Detectors Request For The Train Printing Module For The Augsburg Location Tensile Compression Modulus For Compression And Tensile Tests On Metallic And Fiber Reinforced Ceramic Miniature Specimens Maximum Load 10 Kn Measuring Resolution Sample Heating At Least 1 200Oc Equipped For Use Under A Video Microscope In Air At Room Temperature Prepared For Use In The Scanning Electron Microscope Measurements In Normal Geometry 90OTo The Electron Beam And With Ebsd 20OTo The Electron Beam From Room Temperature To 1 200Oc Control Module With Software And Transducer Both Power And Path Controlled Rules Of The Pulling Process Possible Automatic Operating Modes Cyclic Tests Threshold Or Alternating Load Extensometer Interface For Automatic Image Acquisition Availability Of The Traces At Least As Graphics And Ascii Format Eg B Csv Or Similar Interface For Automatic Image Acquisition The Installation On Site Adequate Training The Module May Occupy A Maximum Of One Port Of The Scanning Electron Microscope During Sem Operation Optional 3 Point Bending Insert 4 Point Bending Insert Time Limit For Receipt Of Tenders Or Requests To Participate Date 13 08 2019 Local Time 10 00 Disclaimer The Above Text Is Machine Translated For Accurate Information Kindly Refer The Original Document
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