Project Name Film Thickness Measuring DeviceTenders Are Invited For Measurement Of Specified Film Properties For 12 Inch Process Film Thickness Refractive Index Reflectivity Stress Etc Products List 1 Film Thickness Measuring DevicePlace Of Implementation ShanghaiBeginning Of Selling Bidding Documents 2018 11 23Ending Of Selling Bidding Documents 2018 11 30Price Of Bidding Documents 1500 265 265Deadline For Submitting Bids Time Of Bid Opening Beijing Time 2018 12 14 15 00
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