Scanning Probe Microscopes – High-Resolution Atomic Force Microscope (Afm). The Subject Of The Procurement Is A High-Resolution Atomic Force Microscope (Afm) Including All Hardware And Software Components Required For Operation. The System Is Used For The High-Resolution Characterization Of Surfaces And Interfaces On The Nano And Atomic Scale, Especially For 3D Afm Measurements In Liquids As Well As Low-Drift Long-Term Measurements In Research Applications.
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