Tender Notice |
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| TenderID | 117103218 |
| Tender Brief | Tenders Are Invited For Double Spherical Aberration Correction Electron Microscope And Transmission Electron Microscope And Cryo-Focused Ion Beam Cutting-Scanning Electron Microscope System Procurement Project |
| Competition Type | ICB/NCB (Plz Refer Document) |
| Funded By | Self-Funded |
| Country | China |
| Tender Value | Plz Refer Document |
| Tender Value In USD | Plz Refer Document |
Key Dates |
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| Publish Date | 19 Aug 2026 |
| Last Date of Bid Submission | 10 Sep 2026 |
CPVs |
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| 38510000-Microscopes | |
Other Detail |
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| View Original Tender Notice / Tender Document |
