The Tender Is For A High-Resolution Scanning Electron Microscope For A Materials Development Laboratory With A Field Emission Source That Can Be Operated In Both High And Low Vacuum. The Device Must Achieve A Maximum Resolution Of At Least 1.0 Nm, Enable The Detection Of Different Electron Signals And Have A Motorized Sample Stage With A Lateral Travel Distance Of At Least 100 Mm X 100 Mm.
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office@ait.ac.at
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