Microscopes – Scanning Electron Microscope. The Aim Is To Purchase A High-Resolution Analytical Scanning Electron Microscope With High Vacuum And Low Vacuum Operation, Integrated Energy-Dispersive X-Ray Microanalysis, Detector Equipment, Sample Positioning, Control And Evaluation Software, Accessories, Installation, Instruction And Application Training. The System Must Be Suitable For Materials Science Investigations, High-Resolution Imaging, Elemental Analysis, Elemental Distribution Images, Automated Measurement Processes And Correlative Sample Navigation.
Contact Information
Contact No.
+49 91318527551
Email
kyle.g.webber@fau.de
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