Tenders Are Invited For Scanning Electron Microscopes – Acquisition Of 1 (One) Double Focused Ion Beam (Fib) ... in Portugal
Tender Notice
TenderID
113751756
Tender Brief
Tenders Are Invited For Scanning Electron Microscopes – Acquisition Of 1 (One) Double Focused Ion Beam (Fib) Microscopy System Coupled To A Field Emission Scanning Electron Microscope (Feg-Sem) For The Associated Laboratory Ciceco Instituto De Materials De Aveiro
Scanning Electron Microscopes – Acquisition Of 1 (One) Double Focused Ion Beam (Fib) Microscopy System Coupled To A Field Emission Scanning Electron Microscope (Feg-Sem) For The Associated Laboratory Ciceco Instituto De Materials De Aveiro. Acquisition Of 1 (One) Double Focused Ion Beam (Fib) Microscopy System Coupled To A Field Emission Scanning Electron Microscope (Feg-Sem) For The Associate Laboratory Ciceco Instituto De Materials De Aveiro
Contact Information
Address
Campus Universitário de Santiago, 25
Contact No.
234370200
Email
contratacao@ua.pt
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