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Tenders Are Invited For X-Ray Diffractometer System For Thin-Film And Powder Structural Analysis (Complete S ... in Japan

Tender Notice

TenderID 112925098
Tender Brief Tenders Are Invited For X-Ray Diffractometer System For Thin-Film And Powder Structural Analysis (Complete Set)
Competition Type ICB/NCB (Plz Refer Document)
Funded By Self-Funded
Country Japan
Tender Value Plz Refer Document
Tender Value In USD Plz Refer Document

Key Dates

Publish Date 08 May 2026
Last Date of Bid Submission 19 Jun 2026

CPVs

38580000-Non-medical equipment based on the use of radiations

Other Detail

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