Contract notice MicroscopesAtomic force microscope AFM Description The atomic force microscope AFM advertised as part of the open procedure is to be used in the professorship for nanoelectronic materials at the Technical Dresden The aim of the tender is to procure a suitable and powerful AFM system whereby delivery installation commissioning and instruction are included in the use evaluation and problem solving The research group focuses on the investigation of the structural mechanical dielectric and piezoelectric properties of silicon based nanowires and hafnium zirconium based ferroelectric layers The following components and service components are included in the service item AFM main chamber CCD camera scanner and sample room Extensibility Band Excitation Spectroscopy BEPS compatible and other measurement modes offline analysis software Delivery assembly commissioning and instruction on site at the client Time limit for receipt of tenders or requests to participate Date 31 08 2020 Local time 14 00 Disclaimer The above text is machine translated For accurate information kindly refer the original document
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