Contract Notice Research And Development Services And Related Consultancy ServicesUltra High Resolution Field Emission Scanning Electron MicroscopeDescription The Call Concerns A High Resolution Scanning Electron Microscope To Be Used For Process Control Of Micro And Nano Fabricated Samples In The Clean Room Of The Leibniz Ipht The Device Will Be Able To Characterize Feature Sizes Down To The Sub Nanometer Range On Substrates Up To 150 Mm 6 In Diameter Allowing For Short Handling Times And Fast Sample Change Intervals Evaluation Criteria Technical Specifications 70 Price 30 Time Limit For Receipt Of Tenders Or Requests To Participate Date 24 09 2019 Local Time 13 00 Disclaimer The Above Text Is Machine Translated For Accurate Information Kindly Refer The Original Document
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